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SEM 掃描電鏡-卡爾蔡司
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CNAS認可項目：否 - Scanning Electron Microscopes. New scanning modes, all-new objective lenses, higher signal detection, and image capture techniques provide the most informative images. Its class-leading X-ray analysis capabilities puts it in the top tier of current analytical SEMs.The new (XVP) Extended Variable Pressure mode now exceeds the limitations of all other VP and LV instruments, providing real leverage against challenging imaging requirements. The EVO XVP offers the ability to investigate non-conducting specimens without intrusive preparation and the possibility to introduce water vapour at sufficient pressures to avoid dehydration damage.The EVO 50EP and EVO 60EP models offer an Extended Pressure range up to 3000 Pa. This enables the imaging of dynamic processes involving water in life science, pharmaceutical and material analysis applications.
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